Laszlo Makai Email & Phone Number | As a Senior Metrology Scientist I gained experience in the fields of optical characterization methods as ellipsometry, reflectometry, FTIR spectroscopy on vast range of advanced materials (Silicon, poly-Si, III-V compound semiconductors, EPI layers, TCOs, solar, dielectrics, SiC, anisotropic materials, ALD layers, graphene, anti-reflection coating). I was the project manager of several advanced metrology product developments at Semilab such as the SE-2000 product family, personally dedicated to the optical system component improvements. My contribution increased the available wavelength range by means of novel NIR spectrometers and a new prism based compensator, DUV performance improved by enhanced mirrors by factor of 5. I created the concept design of a multi-site reflectometry system fits into a FOUP for improved cycle time. After years on my journey the driving force is my curiosity which helps me looking at challenges as opportunities for learning.

Laszlo Makai

As a Senior Metrology Scientist I gained experience in the fields of optical characterization method...
Budapest, Budapest, Hungary

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Laszlo Makai’s Location Budapest, Budapest, Hungary

Laszlo Makai’s Current Industry Semilab

Laszlo Makai’s Prior Industry Nokia Siemens Networks | Georgia

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Product Manager - Team Leader - R&D Ellipsometry products

2021-04-01T00:00:00.000Z - Present

Software engineer

2008-08-01T00:00:00.000Z - 2011-04-01T00:00:00.000Z

Systems engineer

2006-06-01T00:00:00.000Z - 2008-08-01T00:00:00.000Z

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Laszlo Makai is a As a Senior Metrology Scientist I gained experience in the fields of optical characterization methods as ellipsometry, reflectometry, FTIR spectroscopy on vast range of advanced materials (Silicon, poly-Si, III-V compound semiconductors, EPI layers, TCOs, solar, dielectrics, SiC, anisotropic materials, ALD layers, graphene, anti-reflection coating). I was the project manager of several advanced metrology product developments at Semilab such as the SE-2000 product family, personally dedicated to the optical system component improvements. My contribution increased the available wavelength range by means of novel NIR spectrometers and a new prism based compensator, DUV performance improved by enhanced mirrors by factor of 5. I created the concept design of a multi-site reflectometry system fits into a FOUP for improved cycle time. After years on my journey the driving force is my curiosity which helps me looking at challenges as opportunities for learning.