Hikmet Ykselici Email & Phone Number | Research Field: Growth of II-VI semiconductors as thin films on glass slides or as nanometer sized quantum dots in glass and their optical characterization is fundamental research topic. In-situ/ex-situ optical transmission measurements from liquid nitrogen temperature up to 1000oC, photoluminescence, Raman scattering as primary techniques, electro- and photo-modulation spectroscopy for optical characterization and X ray diffraction (XRD) for structural characterization are the experimental methods. Results are discussed on the basis of effective mass model under strong confinement regime, Mie scattering, Urbach rule, diffusion, phonon confinement, Williamson-Hall approach. Defect structures of photo-refractive crystals and their holographic optical properties also are among research topics. In addition to the above mentioned techniques, transmission ellipsometry is employed to determine birefringence. CdS, CdSe, CdTe, ZnO compound semiconductors and pure or doped LiNbO3 crystal are primary materials.

Hikmet Ykselici

Research Field: Growth of II-VI semiconductors as thin films on glass slides or as nanometer sized q...
Turkey

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Hikmet Ykselici’s Email yukseli@yildiz.edu.tr

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Hikmet Ykselici is a Research Field: Growth of II-VI semiconductors as thin films on glass slides or as nanometer sized quantum dots in glass and their optical characterization is fundamental research topic. In-situ/ex-situ optical transmission measurements from liquid nitrogen temperature up to 1000oC, photoluminescence, Raman scattering as primary techniques, electro- and photo-modulation spectroscopy for optical characterization and X ray diffraction (XRD) for structural characterization are the experimental methods. Results are discussed on the basis of effective mass model under strong confinement regime, Mie scattering, Urbach rule, diffusion, phonon confinement, Williamson-Hall approach. Defect structures of photo-refractive crystals and their holographic optical properties also are among research topics. In addition to the above mentioned techniques, transmission ellipsometry is employed to determine birefringence. CdS, CdSe, CdTe, ZnO compound semiconductors and pure or doped LiNbO3 crystal are primary materials.